Boundary structure of Y-ZrO2 grains as derived from high-resolution electron microscopy

被引:2
|
作者
Kumao, A [1 ]
Nakamura, N
Endoh, H
Okamoto, Y
Suzuki, M
机构
[1] Kyoto Inst Technol, Dept Elect & Informat Sci, Sakyo Ku, Kyoto 6068585, Japan
[2] Kyoto Inst Technol, Dept Chem & Mat Technol, Sakyo Ku, Kyoto 6068585, Japan
[3] Jeol Ltd, Elect Opt Div, Akishima, Tokyo 1960021, Japan
来源
关键词
superplastic ceramics; compressive deformation; amorphous layer; grain boundary sliding; EDS analysis; indices of boundary planes;
D O I
10.4028/www.scientific.net/MSF.304-306.567
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The grain boundary structure of an yttria doped tetragonal zirconia polycrystal( Y-ZrO2 or Y-TZP), composed of small-sized grains, was examined by means of electron microscopy and energy dispersive X-ray spectroscopy EDS. Two kinds of Y-TZP materials, the original sample and the sample decreased to 53% in length that of the original sample by compressive deformation at 1300 degrees C, were investigated. The crystallographic structural difference between two samples could not be recognized. Each grain sticks together, and no amorphous phase was observed at the grain boundaries. Grains of Y-TZP usually form boundaries with low index planes such as (111), (110), (310) and (311). It has been revealed that yttria added to zirconia has no measurable effect on the superplastic deformation of this material and the deformation takes place by grain boundary sliding.
引用
收藏
页码:567 / 572
页数:6
相关论文
共 50 条
  • [1] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF MONOCLINIC ZRO2
    VANTENDELOO, G
    ANDERS, L
    THOMAS, G
    JOURNAL DE PHYSIQUE, 1982, 43 (NC-4): : 411 - 412
  • [2] STRUCTURE IMAGES OF Y2O3 BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    OGAWA, K
    IKEDA, S
    SAKATA, K
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1991, 55 (03) : 272 - 278
  • [3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CARBON STRUCTURE
    CRAWFORD, D
    MARSH, H
    JOURNAL OF MICROSCOPY-OXFORD, 1977, 109 (JAN): : 145 - 152
  • [4] High-resolution electron microscopy
    Van Dyck, D
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 123: MICROSCOPY, SPECTROSCOPY, HOLOGRAPHY AND CRYSTALLOGRAPHY WITH ELECTRONS, 2002, 123 : 105 - 171
  • [5] High-Resolution Electron Microscopy
    Zuo, Jian-Min
    MICROSCOPY AND MICROANALYSIS, 2015, 21 (06) : 1657 - 1658
  • [6] A HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ZRO2-CAO FILMS
    SHIOJIRI, M
    HIROTA, Y
    ISSHIKI, T
    MAEDA, T
    SEKIMOTO, S
    THIN SOLID FILMS, 1988, 162 (1-2) : 235 - 246
  • [8] STRUCTURE MODELS FOR BETA-MNGA2S4 AS DERIVED FROM ELECTRON-DIFFRACTION AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
    DEGRAEF, M
    BAKKER, M
    VANHEMERT, M
    VANLANDUYT, J
    AMELINCKX, S
    JOURNAL OF SOLID STATE CHEMISTRY, 1984, 55 (02) : 133 - 149
  • [9] High-resolution electron microscopy for incommensurate structure of KxRhO2 crystal
    Yubuta, Kunio
    Shibasaki, Soichiro
    Terasaki, Ichiro
    Kajitani, Tsuyoshi
    PHILOSOPHICAL MAGAZINE, 2009, 89 (31) : 2813 - 2822
  • [10] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF A SIGMA=27 BOUNDARY IN SILICON
    CUNNINGHAM, B
    STRUNK, HP
    AST, DG
    SCRIPTA METALLURGICA, 1982, 16 (04): : 349 - 352