Critical behavior near ferromagnetic-paramagnetic phase transition in ion-beam sputtered Cr70Fe30 thin films

被引：1
|
作者：
Kumar, B. Ravi [1 ]
Kaul, S. N. [1 ]
机构：
[1] Univ Hyderabad, Sch Phys, Hyderabad 500046, Andhra Pradesh, India
来源：
PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS & MATERIAL SCIENCE (RAM 2013) | 2013年 / 1536卷
关键词：
Critical phenomena; Second-order phase transition; Critical exponents; Magnetic thin films;
D O I：
10.1063/1.4810546
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A detailed scaling equation of state analysis of the de superposed ac susceptibility data taken on ion-beam sputtered Cr70Fe30 thin films of nominal thickness 500, 200, 80, 40 and 20 nm reveals that, irrespective of the film thickness, this system behaves as a three-dimensional Heisenberg ferromagnet in critical region.
引用
收藏
页码：953 / 954
页数：2
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