Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-contrast STEM

被引：1
|
作者：
Abe, E. [1 ]
Seki, T. [1 ]
Pennycook, S. J. [2 ]
机构：
[1] Univ Tokyo, Dept Mat Sci & Engn, Tokyo 1138656, Japan
[2] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37830 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609095415
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：772 / 773
页数：2
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