Void Formation in Growing Oxide Scales with Schottky Defects and p-type conduction

被引：6
|
作者：
Maruyama, Tohio [1 ]
Akiba, Kojiro [1 ]
Ueda, Mitsutoshi [1 ]
Kawamura, Kenichi [1 ]
机构：
[1] Tokyo Inst Technol, Dept Met & Ceram Scince, Meguro Ku, Tokyo 1528552, Japan
来源：
HIGH TEMPERATURE CORROSION AND PROTECTION OF MATERIALS 7, PTS 1 AND 2 | 2008年 / 595-598卷
关键词：
Divergence of ionic flux; Void formation; Growing scale; Schottky defect; p-type conduction;
D O I：
10.4028/www.scientific.net/MSF.595-598.1039
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A quantitative elucidation of the void formation in a growing scale with Schottky defects and p-type conductior during high temperature oxidation of metals. The evaluation or the divergence of ionic fluxes indicates that (1) Voids form in the scale preferentially in the vicinity of the metal/scale interface, (2) The volume of voids increases in a parabolic manner, (3) The volume fraction of voids and the scale is independent of time. The comparison between the calculation and the experimentally observed scale microstructure of NiO and CoO confirmed well the validity of the prediction.
引用
收藏
页码：1039 / 1046
页数：8
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