Degradation of organic light-emitting diodes: dependence on deposition rate

被引：0
|
作者：
Liu, Shun-Wei [1 ,2 ]
Lw, Chih-Chien [3 ]
Huang, Guo-Jun [3 ]
Lee, Jiun-Haw [1 ]
Chen, Chin-Ti [2 ]
Wang, Juen-Kai [4 ,5 ]
机构：
[1] Natl Taiwan Univ, Grad Inst Photon & Optoelect, Taipei 106, Taiwan
[2] Acad Sinica, Inst Chem, Taipei 11529, Taiwan
[3] Natl Taiwan Univ Sci & Techonol, Dept Elect Engn, Taipei 106, Taiwan
[4] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan
[5] Acad Sinica, Inst Atom & Mol Sci, Taipei 106, Taiwan
来源：
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年
关键词：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The dependence of device degradation of organic light-emitting diodes (OLEDs) on film deposition rate is presented. The OLEDs made by lower deposition rates exhibit short device lifetime, which is attributed to the formed ordered aggregates. (C)2008 Optical Society of America
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页码：2269 / +
页数：2
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