Anomalous helicity-dependent photocurrent in the topological insulator (Bi0.5Sb0.5)2Te3 on a GaAs substrate

被引:13
|
作者
Qu, Dong-Xia [1 ]
Che, Xiaoyu [2 ]
Kou, Xufeng [2 ,3 ]
Pan, Lei [2 ]
Crowhurst, Jonathan [1 ]
Armstrong, Michael R. [1 ]
Dubois, Jonathan [1 ]
Wang, Kang L. [2 ]
Chapline, George F. [1 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA USA
[3] ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
关键词
EL2; POLARIZATION; BI2SE3; DEFECT; LEVEL;
D O I
10.1103/PhysRevB.97.045308
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The emergingmaterial, topological insulator, has provided newopportunities for spintronic applications, owing to its strong spin-orbit character. Topological insulator based heterostructures that display spin-charge coupling driven by topology at surfaces have great potential for the realization of novel spintronic devices. Here, we report the observation of anomalous photogalvanic effect in (Bi0.5Sb0.5)(2)Te-3 thin films grown on GaAs substrate. We demonstrate that the magnitude, direction, and temperature dependence of the helicity-dependent photocurrent (HDPC) can be modulated by the gate voltage. From spatially resolved photocurrent measurements, we show that the line profile of HDPC in (Bi0.5Sb0.5)(2)Te-3/GaAs is unaffected by the variation of beam size, in contrast to the photocurrent response measured in a (Bi0.5Sb0.5)(2)Te-3/mica structure.
引用
收藏
页数:9
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