Real-Time Beam Profile Uniformity Monitoring System

被引：0

作者：

Britvitch, I. ^{[1
]}

Hajdas, W. ^{[1
]}

Scherrer, S. ^{[1
]}

Egli, K. ^{[1
]}

Mozzanica, A. ^{[1
]}

Schmitt, B. ^{[1
]}

机构：

[1] Paul Scherrer Inst, Villigen, Switzerland

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2013年 / 60卷 / 05期

关键词：

High energy physics instrumentation; instrumentation and measurement; particle beam measurements; radiation monitoring;

D O I：

10.1109/TNS.2013.2280032

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

New, multi-pixel, air-filled ionization chamber for beam monitoring was constructed. For processing of 400 input signals, it utilizes a dedicated, homemade ASIC. Device parameters: sensitivity, resolution, dynamic range, etc. are discussed together with results from the particle beam tests.

引用

页码：3802 / 3804

页数：3