Characterization of a Fresnel zone plate using higher-order diffraction

被引:14
|
作者
Takeuchi, A [1 ]
Suzuki, Y [1 ]
Takano, H [1 ]
机构
[1] SPring 8, Mikazuki, Hyogo 6795198, Japan
来源
关键词
Fresnel zone plates; higher-order diffraction; X-ray microbeams;
D O I
10.1107/S0909049502004740
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction. The Fresnel zone plate was fabricated by the electron-beam lithography technique. The zone material was made from 1 mum-thick tantalum and the outermost zone width was 0.25 mum. The third-order focused spot size measured by the knife-edge scan method was 0.1 mum full width at half-maximum at an X-ray energy of 8 keV, which is exactly equal to one-third of the first-order focal spot size.
引用
收藏
页码:115 / 118
页数:4
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