Near-field Raman microscopy

被引：18
|
作者：
Anderson, Neil [1 ]
Hartschuh, Achim [2 ]
Novotny, Lukas [1 ]
机构：
[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
[2] Univ Siegen, D-57068 Siegen, Germany
来源：
MATERIALS TODAY | 2005年 / 8卷 / 05期
关键词：
D O I：
10.1016/S1369-7021(05)00846-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Near-field microscopy offers the power of optical characterization with nanometer spatial resolution (similar to 15 nm). Combining tip-enhanced microscopy with Raman scattering spectroscopy results in the ability to localize distinct spectral features, providing a unique opportunity to characterize materials on length scales of a few nanometers using visible light.
引用
收藏
页码：50 / 54
页数：5
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