Cyclotron resonance and magnetotransport measurements in AlxGa1-xN/GaN heterostructures for x=0.15-0.30

被引:14
|
作者
Li, ZF
Lu, W
Shen, SC
Holland, S
Hu, CM
Heitmann, D
Shen, B
Zheng, YD
Someya, T
Arakawa, Y
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany
[3] Univ Hamburg, Zentrum Mikrostrukturforsch, D-20355 Hamburg, Germany
[4] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[5] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[6] Univ Tokyo, Inst Ind Sci, Minato Ku, Tokyo 1068558, Japan
[7] Univ Tokyo, Adv Sci & Technol Res Ctr, Minato Ku, Tokyo 1068558, Japan
关键词
D O I
10.1063/1.1435074
中图分类号
O59 [应用物理学];
学科分类号
摘要
Cyclotron resonance (CR) and magnetotransport experiments have been performed on modulation Si-doped AlxGa1-xN/GaN heterostructures with aluminum fraction x varying from 0.15 to 0.30. A clear CR absorption and Shubnikov-de Haas oscillations have been observed. The CR line shapes are analyzed by calculating the high frequency conductivity of a two-dimensional electron gas. The obtained electron effective mass m* and scattering time tau are found to depend on the aluminum fraction x. For x=0.30 the measured CR frequency shifts significantly upward, which demonstrates the formation of potential fluctuations in AlxGa1-xN/GaN heterostructures with large aluminum fraction x. (C) 2002 American Institute of Physics.
引用
收藏
页码:431 / 433
页数:3
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