IR-ATR investigation of surface anisotropy in silicate glasses

被引:3
|
作者
Ivanovski, Vladimir [1 ]
Mayerhoefer, Thomas G. [2 ,3 ,4 ]
Kriltz, Antje [2 ,3 ]
Popp, Juergen [2 ,3 ,4 ]
机构
[1] Ss Cyril & Methodius Univ Skopje, Inst Chem, Fac Nat Sci & Math, Arhimedova 5, Skopje 1000, Macedonia
[2] Friedrich Schiller Univ, Inst Phys Chem, Helmholtzweg 4, D-07743 Jena, Germany
[3] Friedrich Schiller Univ, Abbe Ctr Photan, Helmholtzweg 4, D-07743 Jena, Germany
[4] Leibniz Inst Photon Technol IPHT, Albert Einstein Str 9, D-07745 Jena, Germany
关键词
Silicate glass; Surface anisotropy; IR-ATR; HYDROXYL-GROUPS; SPECTRA; SPECTROSCOPY; CRYSTALS; MODES;
D O I
10.1016/j.saa.2016.10.027
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Several samples of flat soda-lime silicate glass were investigated by the Infrared Attenuated Total Reflection (IR-ATR) spectroscopy technique. The specular reflectance spectra together with the results of the performed dispersion analysis and the generated reflectance spectra, using Fresnel equations, suggest that the samples are isotropic. In contrast, spectra recorded by the ATR technique suggest an anisotropic structure on the surface of the specimen different from that in the bulk. This is established through differences in the s- and p-polarized IR-ATR spectra, which cannot be simply transformed into one another employing Fresnel formula for an isotropic case. It appears that this thin film having a structure different from the bulk is larger than the ATR effective penetration depth of the evanescent ray for each incidence angle above the critical one. The investigation suggests C-2 symmetry of the SiO4 unit. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:608 / 617
页数:10
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