Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser

被引：17

作者：

Uhlen, Fredrik ^{[1
]}

Nilsson, Daniel ^{[1
]}

Holmberg, Anders ^{[1
]}

Hertz, Hans M. ^{[1
]}

Schroer, Christian G. ^{[2
]}

Seiboth, Frank ^{[2
]}

Patommel, Jens ^{[2
]}

Meier, Vivienne ^{[2
]}

Hoppe, Robert ^{[2
]}

Schropp, Andreas ^{[3
]}

Lee, Hae Ja ^{[3
]}

Nagler, Bob ^{[3
]}

Galtier, Eric ^{[3
]}

Krzywinski, Jacek ^{[3
]}

Sinn, Harald ^{[4
]}

Vogt, Ulrich ^{[1
]}

机构：

[1] KTH AlbaNova, Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden

[2] Tech Univ Dresden, Inst Struct Phys, D-01062 Dresden, Germany

[3] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA

[4] European XFEL GmbH, D-22607 Hamburg, Germany

来源：

OPTICS EXPRESS | 2013年 / 21卷 / 07期

基金：

瑞典研究理事会;

关键词：

ZONE PLATES; SPECTROSCOPY; RAMAN;

D O I：

10.1364/OE.21.008051

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Focusing hard x-ray free-electron laser radiation with extremely high fluence sets stringent demands on the x-ray optics. Any material placed in an intense x-ray beam is at risk of being damaged. Therefore, it is crucial to find the damage thresholds for focusing optics. In this paper we report experimental results of exposing tungsten and diamond diffractive optics to a prefocused 8.2 keV free-electron laser beam in order to find damage threshold fluence levels. Tungsten nanostructures were damaged at fluence levels above 500 mJ/cm(2). The damage was of mechanical character, caused by thermal stress variations. Diamond nanostructures were affected at a fluence of 59 000 mJ/cm(2). For fluence levels above this, a significant graphitization process was initiated. Scanning Electron Microscopy (SEM) and mu-Raman analysis were used to analyze exposed nanostructures. (c) 2013 Optical Society of America

引用

页码：8051 / 8061

页数：11

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