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- [8] Establishing On-Wafer Calibration Standards for the 16-Term Error Model: Application to Silicon High-Frequency Transistor Characterization IEEE JOURNAL OF MICROWAVES, 2024, 4 (03): : 381 - 388
- [10] 16-Term On-Wafer Calibration with Leaky Standards and Flexible Algorithm Definition 2022 52ND EUROPEAN MICROWAVE CONFERENCE (EUMC), 2022, : 5 - 8