YBa2Cu3O7-delta/Ag bi-epitaxial grain boundary junctions for flux-flow devices

被引：2
|
作者：
Wen, ZM
Abe, H
机构：
[1] Semiconductor Technology Laboratory, R and D Group, Oki Electric Industry Co. Ltd., Hachioji, Tokyo 193, 550-5, Higashiasakawa
来源：
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1996年 / 9卷 / 4A期
关键词：
D O I：
10.1088/0953-2048/9/4A/020
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have successfully achieved high-T-c superconducting Josephson junctions using bi-crystal YBa2Cu3O7-delta (YBCO)/Ag films for the first time. Utilizing a chemical vapour deposition (CVD) method, the YBCO/Ag films were formed onto SrTiO3 bi-crystal substrates. The addition of the Ag changed electric properties of the grain boundaries in the YBCO superconductor and the fabricated junctions showed reproducible Josephson behaviour. The response to applied magnetic field exhibited transistor characteristics based on Josephson flux-(vortex-) flow phenomena.
引用
收藏
页码：A76 / A78
页数：3
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