Iodine induced damage in semiconductor materials during heavy ion recoil elastic recoil detection analysis

被引：0
|
作者：
Walker, SR [1 ]
Johnston, PN [1 ]
Bubb, IF [1 ]
Stannard, WB [1 ]
Jamieson, DN [1 ]
Dooley, SP [1 ]
Cohen, DD [1 ]
Dytlewski, N [1 ]
Martin, JW [1 ]
机构：
[1] ROYAL MELBOURNE INST TECHNOL,DEPT APPL PHYS,MELBOURNE,VIC 3001,AUSTRALIA
来源：
ION BEAM MODIFICATION OF MATERIALS | 1996年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：849 / 852
页数：4
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