Fourier analysis;
Numerical approximations and analysis;
Electrical properties;
INVERSION;
D O I:
10.1093/gji/ggt096
中图分类号:
P3 [地球物理学];
P59 [地球化学];
学科分类号:
0708 ;
070902 ;
摘要:
The approximate forward modelling method using Fourier analysis has been used in 2-D applications for several decades. It involves decomposition of the terrain parameters, either the resistivity or the layer thickness, into a Fourier series expansion to simplify the problem to that of a 1-D situation. In this study, the Fourier analysis is applied to 3-D forward modelling for the purposes of shallow DC resistivity imaging with pole-pole array. Our work is to assess advantages and drawbacks of the simplified approach by comparing to exact 3-D solutions, method of moments (MoM) and surface integrals and to the Born approximation applied to MoM. While the Fourier analysis method offers very short calculation times, it shows a significant, albeit systematic, reduction of the anomaly amplitudes; and its ability to delineate anomaly sources is lower than the other methods. Nevertheless, its rapidity makes it an interesting first approach in the modelling of DC resistivity results.
机构:
Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England
Culham Sci Ctr, CCFE, Abingdon OX14 3DB, Oxon, EnglandUniv York, Dept Phys, York YO10 5DD, N Yorkshire, England
Easy, L.
Militello, F.
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机构:
Culham Sci Ctr, CCFE, Abingdon OX14 3DB, Oxon, EnglandUniv York, Dept Phys, York YO10 5DD, N Yorkshire, England
Militello, F.
Omotani, J.
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机构:
Culham Sci Ctr, CCFE, Abingdon OX14 3DB, Oxon, EnglandUniv York, Dept Phys, York YO10 5DD, N Yorkshire, England
Omotani, J.
Walkden, N. R.
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机构:
Culham Sci Ctr, CCFE, Abingdon OX14 3DB, Oxon, EnglandUniv York, Dept Phys, York YO10 5DD, N Yorkshire, England
Walkden, N. R.
Dudson, B.
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机构:
Univ York, Dept Phys, York YO10 5DD, N Yorkshire, EnglandUniv York, Dept Phys, York YO10 5DD, N Yorkshire, England