Semiconductor investigation by terahertz radiation pulses

被引:0
|
作者
Krotkus, Arunas [1 ]
Arlauskas, A. [1 ]
Adomavicius, R. [1 ]
机构
[1] Ctr Phys Sci & Technol, LT-01180 Vilnius, Lithuania
关键词
terahertz pulses; tunable femtosecond laser; narrow gap semiconductors; intervalley energy separation; GaAsBi; CARRIER DYNAMICS; GAAS; EMISSION; SPECTROSCOPY; THZ;
D O I
10.1117/12.929130
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Several applications of terahertz radiation pulses for characterizing semiconductor bulk materials and structures are described. Terahertz pulses emitted at the surfaces illuminated by femtosecond laser of a tunable wavelength are demonstrated to provide information on the electron energy spectrum in the conduction band as well as on the subsurface band bending. On the other hand, by sampling the conductivity of various structures with short electrical field transient photoexcited electron dynamics can be directly studied at its initial, subpicosecond time scale. Narrow gap semiconductors InSb and InAs as well as novel materials such as GaAsBi or self-assembled InAs quantum dots were characterized by using terahertz radiation pulses.
引用
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页数:10
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