High-efficiency and low-distortion directly-ion-implanted GaAs power MESFET's for digital personal handy-phone applications

被引:17
|
作者
Lai, YL
Chang, EY
Chang, CY
Tai, MC
Liu, TH
Wang, SP
Chuang, KC
Lee, CT
机构
[1] NATL CHIAO TUNG UNIV, INST ELECT, HSINCHU 300, TAIWAN
[2] NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU 300, TAIWAN
[3] NATL NANO DEVICE LABS, HSINCHU 300, TAIWAN
[4] HEXAWAVE INC, HSINCHU 300, TAIWAN
[5] NATL CENT UNIV, INST OPT SCI, CHUNGLI 320, TAIWAN
关键词
Electric losses - Gates (transistor) - Ion implantation - Monolithic microwave integrated circuits - Personal communication systems - Phase shift keying - Semiconducting gallium arsenide - Semiconductor device manufacture;
D O I
10.1109/55.622519
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report a high-efficiency and low-distortion GaAs power MESFET using direct ion implantation technology for the digital wireless personal handy-phone system (PHS). When qualified by 1.9-GHz pi/4-shifted quadrature phase shift keying (QPSK) modulated PBS standard signals, the 2.2-V-operation device with a gate width (W-g) of 2 mm exhibited a power-added efficiency (PAE) of 57.2% and an adjacent channel leakage power (P-adj) of -58 dBc at an output power of 21.3 dBm. The MESFET with the optimized direct ion implantation conditions and fabrication process achieved the highest PAE for PHS applications, The low-cost MMIC-oriented direct ion implantation technology has demonstrated the state-of-the-art results for new-generation PHS handsets for the first time.
引用
收藏
页码:429 / 431
页数:3
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