Strategies to reduce complete heart block risk after device closure of ventricular septal defects

被引：1
|
作者：
Bu, Haisong [1 ]
Yang, Yifeng [1 ]
机构：
[1] Cent South Univ, Xiangya Hosp 2, Dept Cardiovasc Surg, 139 Renmin Cent Rd, Changsha 410011, Hunan, Peoples R China
来源：
INTERNATIONAL JOURNAL OF CARDIOLOGY | 2020年 / 320卷
关键词：
D O I：
10.1016/j.ijcard.2020.07.006
中图分类号：
R5 [内科学];
学科分类号：
1002 ; 100201 ;
摘要：
引用
收藏
页码：77 / 77
页数：1
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