Introduction to special section on selected papers from EOS/ESD Symposium 2004

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作者：

Iyer, NM

机构：

来源：

MICROELECTRONICS RELIABILITY | 2006年 / 46卷 / 5-6期

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D O I：

10.1016/j.microrel.2005.10.012

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：655 / 655

页数：1

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