Effect of Zn doping on stability of ZnO varistors under high pulse-current stress

被引:14
|
作者
Jiang, Shenglin [1 ]
Wang, Yaping [1 ]
Zhang, Xiaoshan [2 ,3 ]
Xu, Yuchun [1 ]
Liu, Pin [1 ]
Zeng, Yike [1 ]
Wang, Qing [2 ]
Zhang, Guangzu [1 ,2 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China
[2] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[3] Sichuan Univ, Coll Mat Sci & Engn, Chengdu 610064, Peoples R China
基金
中国国家自然科学基金;
关键词
Electrical properties; ZnO varistor; Zn doping; Pulse-current aging behavior; ZINC-OXIDE VARISTORS; ELECTRICAL-PROPERTIES; DEGRADATION BEHAVIOR; GRAIN-GROWTH; MICROSTRUCTURE;
D O I
10.1016/j.ceramint.2015.05.120
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The electrical properties, especially the degradation behavior against pulse-current stress, of the ZnO-based varistors with different doping contents of Zn have been investigated. The results show that the breakdown field (E-1 mA/cm2) and the nonlinear coefficient (alpha) decreases with the increasing content of Zn due to the increase in the amount of the non-effective grain boundaries and the reduced barrier height. The doped Zn ions, acting as donors, enhance the electron concentration in grains and result in the decrease of the clamping voltage ratio (K) for the pulse-current. The varistors with 3.0 mol% doped Zn possess a K in the range from 2.11 to 2.41, and after applying a surge-current of 6000 A, the variation rate of the breakdown field (% Delta E-1 mA/cm2) is only -9.8%, almost three times smaller than that of the samples without Zn doping. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
引用
收藏
页码:11611 / 11617
页数:7
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