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Strain and lattice distortion in (110)-epitaxial orthorhombic TbMnO3 multiferroic thin films grown by pulsed laser deposition
被引:6
|作者:
Hu, Y.
[1
]
Bator, M.
[1
]
Kenzelmann, M.
[2
]
Lippert, T.
[1
]
Niedermayer, C.
[3
]
Schneider, C. W.
[1
]
Wokaun, A.
[1
]
机构:
[1] Paul Scherrer Inst, Gen Energy Res Dept, CH-5232 Villigen, Switzerland
[2] Paul Scherrer Inst, Lab Dev & Methods, CH-5232 Villigen, Switzerland
[3] Paul Scherrer Inst, Neutron Scattering Lab, CH-5232 Villigen, Switzerland
关键词:
Multiferroic;
Thin film growth;
PLD;
Strain;
D O I:
10.1016/j.apsusc.2011.10.082
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Untwinned single phase thin films of multiferroic orthorhombic TbMnO3 are deposited by pulsed laser deposition on (1 1 0)-oriented NdGaO3 and YAlO3 substrates. X-ray diffraction measurements show that these films grow with a (1 1 0)-expitaxy on both substrates and the (1 1 0)-plane of a film shows a more square-like distortion imposed by the underlying substrate. Therefore, these films are under tensile strain along the [0 0 1] direction on NdGaO3. In the case of TbMnO3 on YAlO3, the film shows an unexpected tensile strain also along [0 0 1] contrary to expectations. X-ray reciprocal mapping confirms that with increasing thickness the film lattice parameters relax towards bulk values. In addition, an increase in mosaicity is also observed. (C) 2011 Elsevier B. V. All rights reserved.
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页码:9323 / 9325
页数:3
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