Diffraction-suppressed high-resolution imaging through metallodielectric nanofilms

被引：41
|
作者：
Feng, SM [1 ]
Elson, JM [1 ]
机构：
[1] USN, Dept Res, Warfare Ctr, China Lake, CA 93555 USA
来源：
OPTICS EXPRESS | 2006年 / 14卷 / 01期
关键词：
D O I：
10.1364/OPEX.14.000216
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We show that diffraction-suppressed propagation of light can be achieved in one-dimensional multilayer metal-dielectric structure, leading to high-resolution imaging through metallodielectric nanofilms.
引用
收藏
页码：216 / 221
页数：6
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