Magnetoresistance in Co/ZnO Films

被引:0
|
作者
Li, Xiao-Li [1 ,2 ]
Quan, Zhi-Yong [1 ]
Xu, Xiao-Hong [1 ]
Wu, Hai-Shun [1 ]
Gehring, G. A. [3 ]
机构
[1] Shanxi Normal Univ, Sch Chem & Mat Sci, Linfen 041004, Peoples R China
[2] Taiyuan Univ Technol, Coll Chem & Chem Engn, Taiyuan 030024, Peoples R China
[3] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
关键词
Annealing; magnetic semiconductor; magnetoresistance (MR); sputtering;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
[Co(0.6 nm)/ZnO(x nm)] 60 (x = 0.3 - 3) films were deposited on glass substrates by magnetron sputtering, and then annealed in vacuum. The large negative magnetoresistance of -10.4% is observed in the as-deposited [Co(0.6 nm)/ZnO(0.4 nm)] 60 film. When ZnO layer thickness is increased from 0.3 to 3 nm, MR ratios of the as-deposited Co/ZnO films are gradually decreased and MR ratios of the annealed films are increased, which might be attributed to the transformation of the structures from the multilayers to granular films during annealing. And the postannealing process makes the magnetism of the films transform from superparamagnetism to ferromagnetism due to Co precipitation in granular films after annealing.
引用
收藏
页码:2684 / 2687
页数:4
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