Development of Tools to Increase the Spatial Resolution of EBSD Maps

被引：1
|
作者：
Pinard, Philippe T. [1 ]
Hovington, Pierre [2 ]
Lagace, Marin [2 ]
Gauvin, Raynald [1 ]
机构：
[1] McGill Univ, Mat & Min Eng Dept, Montreal, PQ H3A 2B2, Canada
[2] Hydro Quebec Res Inst, Varennes, PQ J3X 1S1, Canada
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
ELECTRON BACKSCATTERED DIFFRACTION;
D O I：
10.1017/S1431927609097116
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：422 / 423
页数：2
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