HIGHLY RELIABLE ENCAPSULANTS FOR MICROELECTRONICS DEVICES

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作者：
Koniger, Tobias
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来源：
ELECTRONICS WORLD | 2013年 / 119卷 / 1932期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：34 / 37
页数：4
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