ICMAT 2011-Reliability and variability of semiconductor devices and ICs

被引：0
|
作者：
Asenov, Asen [1 ]
Schlichtmann, Ulf [2 ]
Tan, Cher Ming [3 ]
Wong, Hei [4 ]
Zhou, Xing [3 ]
机构：
[1] Univ Glasgow, Glasgow G12 8QQ, Lanark, Scotland
[2] Tech Univ Muenchen, Munich, Germany
[3] Nanyang Technol Univ, Singapore, Singapore
[4] City Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
来源：
MICROELECTRONICS RELIABILITY | 2012年 / 52卷 / 08期
关键词：
D O I：
10.1016/j.microrel.2012.05.003
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1531 / 1531
页数：1
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