Scanning electron microscopy in the failure analysis laboratory.

被引:0
|
作者
Nicolas, DP [1 ]
机构
[1] NASA,GEORGE C MARSHALL SPACE FLIGHT CTR,HUNTSVILLE,AL 35812
关键词
D O I
暂无
中图分类号
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号
100101 ;
摘要
引用
收藏
页码:87 / 87
页数:1
相关论文
共 50 条
  • [1] DEVICE FAILURE ANALYSIS BY SCANNING ELECTRON MICROSCOPY
    THORNTON, PR
    DAVIES, IG
    SHAW, DA
    SULWAY, DV
    WAYTE, RC
    MICROELECTRONICS RELIABILITY, 1969, 8 (01) : 33 - &
  • [2] FAILURE ANALYSIS OF MICROCIRCUITRY BY SCANNING ELECTRON MICROSCOPY
    THORNTON, PR
    HUGHES, KA
    KYAW, H
    MILLWARD, C
    SULWAY, DV
    MICROELECTRONICS RELIABILITY, 1967, 6 (01) : 9 - &
  • [3] SCANNING ELECTRON-MICROSCOPY AS AN INTEGRAL TECHNIQUE IN FAILURE ANALYSIS
    BRADLEY, SA
    DAHLBERG, EP
    MATERIALS EVALUATION, 1977, 35 (11) : 43 - 48
  • [4] SCANNING ELECTRON-MICROSCOPY AS AN INTEGRAL TECHNIQUE IN FAILURE ANALYSIS
    BRADLEY, SA
    DAHLBERG, EP
    MATERIALS EVALUATION, 1976, 34 (09) : P5 - P5
  • [5] Scanning Electron Acoustic Microscopy: A novel tool for failure analysis & microcharacterisation
    Wong, WK
    Yin, QR
    Thong, JTL
    Phang, JCH
    Fang, JW
    ISTFA 2000: PROCEEDINGS OF THE 26TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2000, : 11 - 16
  • [6] Forward scattered scanning electron microscopy for semiconductor metrology and failure analysis
    Vanderlinde, WE
    IPFA 2004: PROCEEDINGS OF THE 11TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2004, : 9 - 9
  • [7] Failure Analysis of an Automotive Component (Cardan Yoke) by Scanning Electron Microscopy
    Couto, A. A.
    Andrade, A. H. P.
    Reis, D. A. P.
    Vatavuk, J.
    DIFFUSION IN SOLIDS AND LIQUIDS VII, 2012, 326-328 : 187 - +
  • [8] FAILURE ANALYSIS OF TYPE 330 WELDS BY SCANNING ELECTRON MICROSCOPY.
    Koch, J.B.
    Hill, K.A.
    Welding Journal (Miami, Fla), 1980, 59 (08):
  • [9] FAILURE ANALYSIS OF TYPE-330 WELDS BY SCANNING ELECTRON-MICROSCOPY
    KOCH, JB
    HILL, KA
    WELDING JOURNAL, 1980, 59 (08) : S242 - S244
  • [10] THE USE OF THE SCANNING ELECTRON-MICROSCOPY IN THE ELECTRICAL INDUSTRY-FAILURE ANALYSIS
    FEDELI, G
    PIZZI, F
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A60 - A61