An in-depth investigation of physical properties of Nd doped CdS thin films for optoelectronic applications

The different contents (0 wt.%, 1 wt.%, 3 wt.% and 5 wt.%) of Nd @CdS films were casted using spray pyrolysis deposition procedure. The preferential orientation of crystallites along (002) for all films was noted by XRD profiles. The mean crystalline size (D-avg), strain (E-avg) and dislocation density (delta(avg)) have also been evaluated using XRD results and discussed. The spherical shape morphology of nanoscale particles of Nd@CdS films were analyzed by FE-SEM, exhibits the increased grain sizes with Nd doping concentration. The optical band gaps (2.4-2.36 eV) were found to be decreased with increasing Nd doping content upto (3 wt.%) and increased at 5 wt.% The PL profile displays a stout intensity peak observed at 532 nm and week emission band at 638 nm. The dielectric constant, loss and loss tangent of pristine and Nd@CdS thin films were investigated by dielectric measurements. The optimum values of non-linear refractive index 1.06 x 10(-10), 4.41 x 10(-11), 3.44 x 10(-11) and 1.85 x 10(-10) were observed for Nd content varies from pristine to 5 wt.% respectively. Furthermore, optimum non-linear susceptibility values 7.31 x 10(-12), 1.079 x 10(-12), 4.53 x 10(-13) and 1.36 x 10(-11) were observed for 0, 1, 3 and 5 wt.% of Nd contents respectively in CdS. Such type of characteristics of Nd doped CdS thin films can be useful for optical devices.