Hydrogen-induced degradation in SrTiO3-based grain boundary barrier layer ceramic capacitors

被引：12

作者：

Shen, Z. J. ^{[1
,2
]}

Chen, W. P. ^{[1
,2
,3
,4
]}

Zhu, K. ^{[1
,2
]}

Zhuang, Y. ^{[5
]}

Hu, Y. M. ^{[3
,4
]}

Wang, Y. ^{[3
,4
]}

Chan, H. L. W. ^{[3
,4
]}

机构：

[1] Wuhan Univ, Dept Phys, Wuhan 430072, Peoples R China

[2] Wuhan Univ, Minist Educ, Key Lab Acoust & Photon Mat & Devices, Wuhan 430072, Peoples R China

[3] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China

[4] Hong Kong Polytech Univ, Mat Res Ctr, Hong Kong, Hong Kong, Peoples R China

[5] Guangzhou Sunrise Elect Corp Ltd, Guangzhou 510335, Guangdong, Peoples R China

来源：

CERAMICS INTERNATIONAL | 2009年 / 35卷 / 03期

基金：

中国国家自然科学基金;

关键词：

Failure analysis; Dielectric properties; BaTiO3 and titanates; Capacitors; VAPOR;

D O I：

10.1016/j.ceramint.2008.04.005

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Hydrogen-induced degradation in SrTiO3-based grain boundary barrier layer ceramic capacitors was studied through electrochemical hydrogen charging, in which the capacitors were placed in 0.01 M NaOH solution with hydrogen deposited on their electrodes from the electrolysis of water. The properties of the capacitors were greatly degraded after 0.5 h of treatment: The capacitance was dramatically decreased and the dielectric loss was dramatically increased over the frequency range of 10(2)-10(5) Hz, the leakage current was increased by orders of magnitude. It was proposed that atomic hydrogen diffused relatively easily along the grain boundaries and induced a reduction reaction to the grain boundary layer, which resulted in the degradation observed. Hydrogen-induced degradation is more serious in SrTiO3-based grain boundary barrier layer ceramic capacitors than in other ceramic capacitors and great efforts should be made to prevent hydrogen-induced degradation in them. (C) 2008 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

引用

页码：953 / 956

页数：4