Software Defect Prediction Based on Stability Test Data

被引:0
|
作者
Okumoto, Kazu [1 ]
机构
[1] Alcatel Lucent, Naperville, IL USA
关键词
software defect data; software defect prediction; stability test; test duration; exponential reliability growth model; RELIABILITY;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Software defect prediction is an essential part of evaluating product readiness in terms of software quality prior to the software delivery. As a new software load with new features and bug fixes becomes available, stability tests are performed typically with a call load generator in a full configuration environment. Defect data from the stability test provides most accurate information required for the software quality assessment. This paper presents a software defect prediction model using defect data from stability test. We demonstrate that test run duration in hours is a better measure than calendar time in days for predicting the number of defects in a software release. An exponential reliability growth model is applied to the defect data with respect to test run duration. We then address how to identify whether estimates of the model parameters are stable enough for assuring the prediction accuracy.
引用
收藏
页码:385 / 387
页数:3
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