Time truncated attribute control chart for the Weibull distribution using multiple dependent state sampling

被引：9
|
作者：
Aslam, Muhammad [1 ]
机构：
[1] King Abdulaziz Univ, Dept Stat, Fac Sci, Jeddah 21551, Saudi Arabia
来源：
COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION | 2019年 / 48卷 / 04期
关键词：
Multiple dependent state sampling; Weibull distribution; control chart; truncated life test; average run length;
D O I：
10.1080/03610918.2017.1408823
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
In this article, an attribute control chart is proposed for time truncated tests using the Weibull distribution. The design of proposed control chart is presented using the multiple dependent state (MDS) sampling. The control chart coefficients are determined for various specified average run length. The efficiency of the proposed control chart is elaborated with the help of a simulation data and a real data. The proposed control chart perform better than the existing control chart in terms of average run length.
引用
收藏
页码：1219 / 1228
页数：10
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