Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-Processor SoC Degradation

被引：7

作者：

Zhao, Yong ^{[1
]}

Kerkhoff, Hans G. ^{[1
]}

机构：

[1] Univ Twente, Testable Design & Test Integrated Syst TDT Grp, CTIT, NL-7500 AE Enschede, Netherlands

来源：

2014 17TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD) | 2014年

关键词：

health-monitoring; dependability testing; MP-SoC; prognostics; repair; reliability sensor; nano electronics;

D O I：

10.1109/DSD.2014.80

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health-monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.

引用

页码：154 / 160

页数：7

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