An evaluation of low-cycle fatigue property for Sn-3.5Ag and Sn-0.7Cu lead-free solders using surface deformation

被引:1
|
作者
Takahashi, Takehiko [1 ]
Hioki, Susumu [1 ]
Shohji, Ikuo [2 ]
Kamiya, Osamu [3 ]
机构
[1] Akita Prefectural Univ, Fac Syst Sci & Technol, 84-4 Tsuchiya Ebinokuchi, Akita 0150055, Japan
[2] Gunma Univ, Fac Engn, Kiryu, Gumma 3768515, Japan
[3] Akita Univ, Fac Engn & Res Sci, Akita 0108502, Japan
关键词
lead-free solder; Sn-Ag; Sn-Cu; low-cycle fatigue; surface deformation; surface feature; image processing;
D O I
10.4028/www.scientific.net/KEM.326-328.1035
中图分类号
Q81 [生物工程学(生物技术)]; Q93 [微生物学];
学科分类号
071005 ; 0836 ; 090102 ; 100705 ;
摘要
The low-cycle fatigue behavior and the relationship between the surface features in the low-cycle fatigue testing and the fatigue life of Sn-3.5Ag and Sn-0.7Cu lead-free solders were investigated at strain I-ate of 0.1%/s at room temperature, 80 and 120 degrees C. In addition, the fatigue life was estimated by using the surface deformation of the solders, and image processing. And also, it was compared with Coffin-Manson type of fatigue behavior. The fatigue life of Sn-3.5Ag solder was Superior to that of Sn-0.7Cu solder at temperatures, 80 and 120 degrees C. The fatigue life determined by surface deformation indicated a close behavior to Coffin-Manson type fatigue behavior in those solders. Therefore the low-cycle fatigue life of solders could be estimated by the Surface deformation.
引用
收藏
页码:1035 / +
页数:2
相关论文
共 50 条
  • [1] An evaluation of fatigue damage in low-cycle range for Sn-3.5Ag, Sn-0.7Cu lead-free solders and Sn-Pb eutectic solder using image processing to surface feature
    Takahashi, Takehiko
    Hioki, Susumu
    Shohji, Ikuo
    Kamiya, Osamu
    ADVANCES IN ELECTRONIC PACKAGING 2005, PTS A-C, 2005, : 1811 - 1817
  • [2] Fatigue damage evaluation by surface feature for Sn-3.5Ag and Sn-0.7Cu solders
    Takahashi, T
    Hioki, S
    Shohji, I
    Kamiya, O
    MATERIALS TRANSACTIONS, 2005, 46 (11) : 2335 - 2343
  • [3] Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
    Chih-Kuang Lin
    De-You Chu
    Journal of Materials Science: Materials in Electronics, 2005, 16 : 355 - 365
  • [4] Tensile properties of Sn-3.5Ag and Sn-3.5Ag-0.75Cu lead-free solders
    Shohji, I
    Yoshida, T
    Takahashi, T
    Hioki, S
    MATERIALS TRANSACTIONS, 2002, 43 (08) : 1854 - 1857
  • [5] Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
    Lin, CK
    Chu, DY
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2005, 16 (06) : 355 - 365
  • [6] Low-cycle fatigue behavior of Sn-Ag, Sn-Ag-Cu, and Sn-Ag-Cu-Bi lead-free solders
    Chaosuan Kanchanomai
    Yukio Miyashita
    Yoshiharu Mutoh
    Journal of Electronic Materials, 2002, 31 : 456 - 465
  • [7] Low-cycle fatigue behavior of Sn-Ag, Sn-Ag-Cu, and Sn-Ag-Cu-Bi lead-free solders
    Kanchanomai, C
    Miyashita, Y
    Mutoh, Y
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (05) : 456 - 465
  • [8] Comparison of Interfacial Stability of Pb-Free Solders (Sn-3.5Ag, Sn-3.5Ag-0.7Cu, and Sn-0.7Cu) on ENIG-Plated Cu During Aging
    Yoon, Jeong-Won
    Noh, Bo-In
    Jung, Seung-Boo
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2010, 33 (01): : 64 - 70
  • [9] Temperature dependence of anelastic properties in Sn–Ag–Cu system and Sn-3.5Ag alloys of lead-free solders
    Y. Nakamura
    T. Ono
    Journal of Materials Science, 2005, 40 : 3267 - 3269
  • [10] Low cycle fatigue behavior and surface feature by image processing of Sn-0.7Cu lead-free solder
    Takahashi, T
    Hioki, S
    Shohji, I
    Kamiya, O
    FRACTURE AND STRENGTH OF SOLIDS VI, PTS 1 AND 2, 2006, 306-308 : 115 - 120