Mapping of index of refraction profile for polymer gradient index optics using confocal Raman spectroscopy

被引：0
|
作者：
Kochan, Nicholas S. [1 ]
Schmidt, Greg R. [1 ]
Berger, Andrew J. [1 ]
Moore, Duncan T. [1 ]
机构：
[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
来源：
OPTICAL ENGINEERING | 2020年 / 59卷 / 11期
关键词：
gradient index; optics; metrology; nondestructive measurement; Raman spectroscopy; confocal microscopy; PS/PMMA BINARY FILMS; MUTUAL DIFFUSION; LENS; MACROMOLECULES;
D O I：
10.1117/1.OE.59.11.112605
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Scanning confocal Raman microscopy is proposed to measure a gradient index (GRIN) profile at an optical surface. The Raman microscope is calibrated to index of refraction for a binary copolymer GRIN material, and then the index of refraction is mapped on the plano surface of a GRIN polymer lens. The measurement deduces axial shift of 680 pm and identifies lateral tilt or decenter with respect to the nominal position of the GRIN profile. Results suggest that the mapping method is a nondestructive way to measure the GRIN profile of a GRIN lens and its positioning within the lens geometry, to within the sampling precision of the Raman microscope. (C) The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License.
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页数：10
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