Mapping nanoscale domain patterns in ferroelectric ceramics by atomic force acoustic microscopy and piezoresponse force microscopy

被引：0
|
作者：
Li, Faxin [1 ]
Zhou, Xilong [1 ]
Zeng, Huarong [2 ]
机构：
[1] Peking Univ, Coll Engn, Beijing 100871, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China
来源：
2012 INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS HELD JOINTLY WITH 11TH IEEE ECAPD AND IEEE PFM (ISAF/ECAPD/PFM) | 2012年
关键词：
Ferroelectric ceramics; Domain patterns; Atomic force acoustic microscopy (AFAM); Piezoresponse force microscopy (PFM);
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, nanoscale domain patterns of ferroelectric ceramics were investigated by both piezoelectric force microscopy (PFM) and atomic force acoustic microscopy (AFAM) in the same scanning area. The domain patterns imaged by both the single-frequency AFAM and resonance-tracking AFAM are comparable to that by PFM. Meanwhile, using AFAM, the subsurface domain structures can be observed and quantitative nanomechanical mapping of domains was also realized. Finally, we suggest that PFM plus AFAM should be the best choice for characterization of ferroelectric domains.
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页数：4
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