Specialised excitation and wavelet feature extraction in fault diagnosis of analogue electronic circuits

被引：0

作者：

Chruszczyk, L. ^{[1
]}

Rutkowski, J. ^{[1
]}

机构：

[1] Silesian Tech Univ, Dept Automat Control Elect & Comp Sci, Inst Elect, Gliwice, Poland

来源：

MIXDES 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2008年

关键词：

fault location; fault diagnosis; fault dictionary; wavelet transform; genetic algorithm; analogue electronics;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This article presents design of specialised aperiodic excitation. Purpose is fault diagnosis of analogue electronic circuits. The goal is enhancement of parametric (soft) faults location. Such combination is one of the most difficult diagnosis cases. Further improvement is achieved after utilising wavelet transform as a feature extractor. Obtained results are compared with fault diagnosis by means of the simplest aperiodic function: unit step.

引用

页码：511 / 516

页数：6

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