Electrostatic popping in AMR and GMR heads

被引：4
|
作者：
Baker, BR [1 ]
机构：
[1] Quantum Chem Corp, Milpitas, CA 95035 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1999年 / 35卷 / 05期
关键词：
AMR; dielectric breakdown; GMR; noise;
D O I：
10.1109/20.800897
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Dielectric breakdown of insulating layers between the MRE (magneto resistive element) and the conducting shields generates another type of base line shift or popping noise in MR heads. Pulse shapes are similar to those of thermal asperities, but they can be bipolar and can occur without a disk. Measurements illustrate the difficulties of characterizing these pulses. A physical model is proposed to explain the behavior, and a simple SPICE simulation shows similar pulse behavior.
引用
收藏
页码：2583 / 2585
页数：3
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