On comparing color spaces for fabric defect classification based on local binary patterns

被引：0
|
作者：
Vinh Truong Hoang [1 ]
Rebhi, Ali [2 ]
机构：
[1] Ho Chi Minh City Open Univ, Fac Informat Technol, 97 Vo Van Tan,Dist 3, Ho Chi Minh City, Vietnam
[2] Univ Tunis, Sci Res Lab Signal Image Proc & Energy Mastery SI, 5 Ave Taha Hussein, Tunis 1008, Tunisia
来源：
2018 IEEE 3RD INTERNATIONAL CONFERENCE ON SIGNAL AND IMAGE PROCESSING (ICSIP) | 2018年
关键词：
fabric defect classification; LBP descriptors; image processing; classification; TEXTURE; MACHINE; SYSTEM;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
There is a numerous color spaces with different properties in literature. In order to find the appropriate and relevant color space for the fabric defect classification problem, we propose to investigate the performance and robustness of the Local Binary Pattern (LBP) descriptor in supervised context by using SVM classifier. The experimental results show that the luminance-chrominance spaces are suitable for coding fabric defect with the classification accuracy obtained is 92.1%
引用
收藏
页码：297 / 300
页数：4
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