Floorplanning of memory ICs: Routing complexity vs. yield

被引:0
|
作者
Koren, I [1 ]
Koren, Z [1 ]
机构
[1] Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
关键词
floorplanning; memory; redundancy; yield; routing complexity;
D O I
10.1117/12.346926
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It has recently been shown that for very large chips, especially those with some incorporated redundancy, the chip's floorplan may affect its yield. When selecting a floorplan, the designer should, therefore, consider the expected yield in addition to the traditional objectives such as area, performance, and routing complexity. This paper studies the two seemingly unrelated objectives of routing complexity minimization and yield maximization, and justifies the need for a trade-off analysis when determining the floorplan. We will focus on the analysis of large memory ICs with redundant modules, for which several alternative floorplans may exist.
引用
收藏
页码:297 / 304
页数:8
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