Effect of Sn-doped on microstructural and optical properties of ZnO thin films deposited by sol-gel method

被引:214
|
作者
Tsay, Chien-Yie [1 ]
Cheng, Hua-Chi [2 ]
Tung, Yen-Ting [1 ]
Tuan, Wei-Hsing [3 ]
Lin, Chung-Kwei [1 ]
机构
[1] Feng Chia Univ, Dept Mat Sci & Engn, Taichung 407, Taiwan
[2] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[3] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 106, Taiwan
关键词
Transparent oxide semiconductors; ZnO thin films; Sn doping; Sol-gel method;
D O I
10.1016/j.tsf.2008.06.030
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, transparent thin films of Sn-doped ZnO (ZnO:Sn) were deposited onto alkali-free glass substrates by a sol-gel method; the effect of Sri doping on crystallinity, microstructural and optical properties was investigated. The atomic percentages of dopant in ZnO-based sols were Sn/Zn = 0, 1, 2, 3, and 5 at.%. The as-deposited films were pre-heated at 300 degrees C for 10 min and then annealed in air at 500 degrees C for 1 h. The results show that Sn-doped ZnO thin films demonstrate obviously improved surface roughness, enhanced transmittance in the 400-600 nm wavelength range and reduced average crystallite size. Among all of the annealed ZnO-based films in this study, films doped with 2 at.% Sn concentration exhibited the best properties, namely an average transmittance of 90%, an RMS roughness value of 1.92 nm and a resistivity of 9.3 x 10(2) Omega-cm. (C) 2008 Elsevier B.V All rights reserved.
引用
收藏
页码:1032 / 1036
页数:5
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