High-efficiency AlGaN deep-UV LEDs fabricated on a- and m-axis oriented c-plane sapphire substrates

被引:7
|
作者
Fujikawa, Sachie [1 ]
Hirayama, Hideki [1 ]
Maeda, Noritoshi [1 ]
机构
[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan
关键词
deep-UV LEDs; AlGaN; AlN; MOCVD; step bunching; sapphire; FILMS;
D O I
10.1002/pssc.201100453
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We demonstrated high-efficiency 270 nm-band AlGaN deep-ultraviolet (DUV) light-emitting diodes (LEDs) fabricated on 0.15 off a-and m-axis oriented c-plane (0001) sapphire substrates grown by low-pressure metal organic chemical-vapor deposition (LP-MOCVD). An approximately 4.5 mu m-thick low threading dislocation density (TDD) AlN template was grown on the sapphire substrate by using an NH3 pulsed-flow multilayer (ML) growth method. We found that atomically flat surface can be easily obtained for AlN layer grown on a-axis oriented sample. On the other hand, a step-bunching was observed for the surface of AlN layer grown on m-axis oriented sample. We found, from these results, that a-axis oriented (0001) sapphire is more suitable for obtaining a flat sur-face in AlN template without step-bunching. We also found that shorter wavelength LED can be obtained by using an a-axis oriented (0001) sapphire, because an Al incorporation in AlGaN is slightly high for the growth on a-axis oriented (0001) sapphire. We achieved highefficiency AlGaN quantum well (QW) DUV LEDs on AlN templates grown on both a- and m-axis oriented sapphire substrates. The peak wavelengths of the LEDs fabricated on a- and m-axis oriented sapphire were 270 and 277 nm, respectively. The maximum external quantum efficiencies (EQEs) of the LEDs fabricated on a- and m-axis oriented sapphire were 3.8 and 3.2%, respectively, measured under room temperature (RT) continuous wave (CW) operations. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:790 / 793
页数:4
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