Theoretical study of the properties of X-ray diffraction moire fringes. I

被引:7
|
作者
Yoshimura, Jun-ichi [1 ]
机构
[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan
关键词
diffraction moire fringes; Pendellosung oscillation; phase jump; gap phase; SPHERICAL WAVE THEORY; DYNAMICAL THEORY; ELECTRON MICROGRAPHS; MISFIT BOUNDARY; GENERAL-CONSIDERATIONS; PENDELLOSUNG FRINGES; TRANSLATION-FAULT; ION-IMPLANTATION; CRYSTAL; TOPOGRAPHY;
D O I
10.1107/S2053273315004970
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A detailed and comprehensive theoretical description of X-ray diffraction moire fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory. Firstly, prior to discussing the main subject of the paper, a previous article [Yoshimura (1997). Acta Cryst. A53, 810-812] on the two-dimensionality of diffraction moire patterns is restated on a thorough calculation of the moire interference phase. Then, the properties of moire fringes derived from the above theory are explained for the case of a plane-wave diffraction image, where the significant effect of Pendellosung intensity oscillation on the moire pattern when the crystal is strained is described in detail with theoretically simulated moire images. Although such plane-wave moire images are not widely observed in a nearly pure form, knowledge of their properties is essential for the understanding of diffraction moire fringes in general.
引用
收藏
页码:368 / 381
页数:14
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