Structure determination of thin CoFe films by anomalous x-ray diffraction

被引：3

作者：

Gloskovskii, Andrei ^{[1
]}

Stryganyuk, Gregory ^{[1
]}

Ouardi, Siham ^{[1
]}

Fecher, Gerhard H. ^{[1
,5
]}

Felser, Claudia ^{[5
]}

Hamrle, Jaroslav ^{[2
,4
]}

Pistora, Jaromir ^{[2
,4
]}

Bosu, Subrojati ^{[3
]}

Saito, Kesami ^{[3
]}

Sakuraba, Yuya ^{[3
]}

Takanashi, Koki ^{[3
]}

机构：

[1] Johannes Gutenberg Univ Mainz, Inst Anorgan & Analyt Chem, D-55099 Mainz, Germany

[2] Tech Univ Ostrava, Dept Phys, Ostrava 01187, Czech Republic

[3] Tohoku Univ, IMR, Sendai, Miyagi 9808577, Japan

[4] Tech Univ Ostrava, Nanotechnol Ctr, Ostrava 70833, Czech Republic

[5] Max Planck Inst Chem Phys Solids, D-01187 Dresden, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2012年 / 112卷 / 07期

关键词：

SCATTERING;

D O I：

10.1063/1.4755801

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4755801]

引用

页码：2012 / 10

页数：3

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