Influence of dental resin material composition on cross-polarization-optical coherence tomography imaging

被引:20
|
作者
Lammeier, Carmen
Li, YuPing
Lunos, Scott [2 ]
Fok, Alex
Rudney, Joel
Jones, Robert S. [1 ]
机构
[1] Univ Minnesota, Sch Dent, Div Pediat Dent, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Clin & Translat Sci Inst, Minneapolis, MN 55455 USA
关键词
materials; particle sizing; optical properties; medical imaging; polarization; medicine; REFRACTIVE-INDEX; CARIES LESIONS;
D O I
10.1117/1.JBO.17.10.106002
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
The purpose of this study was to investigate cross-polarization-optical coherence tomography (CP-OCT) signal attenuation through different resin material compositions. Four distinct composite systems were used: Filtek supreme ultra (FSU) (3M ESPE), IPS empress direct (EMD) (Ivoclar Vivadent), estelite sigma quick (SQK) (Tokuyama Dental), and Z100 (3M ESPE). Cross-sectional images of different composite-demineralized phantoms (n = 108) were collected using a 1310-nm intraoral cross-polarization swept source OCT (CP-OCT) imaging system. % T quantified the CP-OCT signal attenuation. Scanning electron microscopy, transmission electron microscopy, and energy-dispersive x-ray spectrometer chemical analysis was utilized to determine how different matrix/filler compositions affected attenuation of the near infrared (NIR) signal. CP-OCT imaging of dental resin composites showed enormous variation in signal attenuation. For each of our composite systems, there was not a consistent attenuation difference in the NIR signal for A to D shades. The four composites had similar measured backscattering values but attenuated the overall signal to different degrees. When comparing the A2 shades between the four different composite systems, the order of highest to lowest of % T was EMD > Z100, FSU > SQK (ANOVA, Tukey, p < 0.0001). As a result, we demonstrate the importance of understanding how the constituents of composite materials affect CP-OCT signal attenuation. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.JBO.17.10.106002]
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页数:10
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