Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

被引：7
|
作者：
Chen, Y. H. [1 ]
Wu, T. B. [2 ]
机构：
[1] Natl Cheng Kung Univ, Dept Earth Sci, Tainan 701, Taiwan
[2] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
来源：
APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 22期
关键词：
atomic force microscopy; electrical conductivity; ferromagnetic materials; grain boundaries; hopping conduction; lanthanum compounds; magnetic thin films; metal-insulator transition; percolation; phase separation; strontium compounds;
D O I：
10.1063/1.3037202
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.
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页数：3
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