Control charts and process capability

被引：0
|
作者：
Wu, Z [1 ]
Tian, Y [1 ]
机构：
[1] Nanyang Technol Univ, Sch Mech & Prod Engn, Singapore 639798, Singapore
来源：
PROCEEDINGS OF THE 2000 IEEE INTERNATIONAL CONFERENCE ON MANAGEMENT OF INNOVATION AND TECHNOLOGY, VOLS 1 AND 2: MANAGEMENT IN THE 21ST CENTURY | 2000年
关键词：
control limits; sample size; run length; confidence level;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A new design algorithm for the (X) over bar &S control charts is presented in this article, in which the detection power is allocated between the (X) over bar chart and the S chart in an optimal manner. This algorithm associates the out-of-control conditions of a process with a degraded value of the process capability ratio C-pk. Specifically, when C-pk decreases to a specified value in any possible pattern, the (X) over bar &S control charts will give a signal within a specified time period with a predetermined confidence level. This algorithm allows the Quality Assurance (QA) engineers to accurately specify the performance characteristics of the control charts (i.e., the in-control and out-of-control run lengths and the associated confidence levels) and assist them to achieve the desired 6-sigma solution.
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页码：904 / 909
页数：6
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