Atomic Arrangement in Two-Dimensional Silica: From Crystalline to Vitreous Structures

被引：78

作者：

Lichtenstein, Leonid ^{[1
]}

Heyde, Markus ^{[1
]}

Freund, Hans-Joachim ^{[1
]}

机构：

[1] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2012年 / 116卷 / 38期

关键词：

FORCE MICROSCOPY; X-RAY; NEUTRON-SCATTERING; ELASTIC PROPERTIES; AB-INITIO; GLASS; QUARTZ; DIFFRACTION; SURFACES; NETWORKS;

D O I：

10.1021/jp3062866

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The atomic structure of vitreous and crystalline regions of a thin silica film on Ru(0001) was investigated using noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM). We were able to resolve the atomic arrangement of the Si and the 0 atoms in the crystalline and the vitreous structures. We discuss characteristic structural properties of the films, such as distances, orientations, and angles, and we compare our results to experiments and simulations of bulk vitreous silica networks. It was found that order in two-dimensional vitreous networks can extend up to 2 nm.

引用

页码：20426 / 20432

页数：7

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