High-Resolution Hierarchical Beam Alignment with Segmented Beams

被引:0
|
作者
Lee, Junho [1 ]
Je, Hui Won [1 ]
Kim, Inhyoung [1 ]
Kim, Min Goo [1 ]
机构
[1] Samsung Elect, Syst LSI Business, Suwon, South Korea
关键词
CHANNEL ESTIMATION; CODEBOOK;
D O I
10.1109/globecom38437.2019.9013257
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
We propose a high-resolution hierarchical beam alignment algorithm that learns millimeter wave channel space using segmented beams obtained from feasible phase shifted sum of given hierarchical basis. To be specific, at each stage, the segmented beam is designed using a linear combination of given training beam basis instead of just choosing a beam among them. Then, the designed beam is used to determine the subset of higher resolution training beam candidates for the next stage which is referred to as the over-complete dictionary embracing even partially overlapped beams as elements. At the next stage, the proposed beam alignment can focus only on the most promising directions associated with finer grids. The simulation results demonstrate that the proposed beam alignment framework can remedy the limitations of the existing grid-of-beams method and achieve favorable beam alignment performance with reduced training time.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] ON THE ALIGNMENT OF A POLARIZING BEAM-SPLITTER IN A 2-BEAM INTERFEROMETER OF HIGH-RESOLUTION
    PROBST, R
    OPTIK, 1985, 70 (02): : 58 - 63
  • [2] HIGH-RESOLUTION BEAM HODOSCOPE COUNTER FOR USE IN VERY INTENSE BEAMS
    AUBERT, JJ
    BASSOMPIERRE, G
    COIGNET, G
    CRESPO, J
    DECLAIS, Y
    MASSONNET, L
    MOYNOT, M
    PAYRE, P
    PERONI, C
    THENARD, JM
    SCHNEEGANS, MA
    NUCLEAR INSTRUMENTS & METHODS, 1979, 159 (01): : 47 - 51
  • [3] SIMPLE METHODS FOR HIGH-RESOLUTION SCANNING OF LASER-BEAMS AND ALIGNMENT OF SMALL SPATIAL FILTERED BEAMS
    EMS, SC
    MARSHALL, TR
    GUCKER, FT
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (04): : 475 - 477
  • [4] THE IMPORTANCE OF BEAM ALIGNMENT AND CRYSTAL TILT IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    SAXTON, WO
    OKEEFE, MA
    WOOD, GJ
    STOBBS, WM
    ULTRAMICROSCOPY, 1983, 11 (04) : 263 - 281
  • [5] HIGH-RESOLUTION ALIGNMENT OF SAMPLED WAVEFORMS
    MCGILL, KC
    DORFMAN, LJ
    IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, 1984, 31 (06) : 462 - 468
  • [6] High-resolution spectroscopy of ion beams
    Cox, SG
    Critchley, ADJ
    McNab, IR
    Smith, FE
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1999, 10 (09) : R101 - R128
  • [7] Beam alignment and related problems of spherical aberration corrected high-resolution TEM Images
    Hu, JJ
    Tanaka, N
    JOURNAL OF ELECTRON MICROSCOPY, 2000, 49 (05): : 651 - 656
  • [8] HIGH-RESOLUTION SAR TOMOGRAPHY VIA SEGMENTED DECHIRPING
    Liu, Minkun
    Wang, Yan
    Ding, Zegang
    Li, Linghao
    Zeng, Tao
    IGARSS 2020 - 2020 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM, 2020, : 100 - 103
  • [9] High-Resolution Fast Beam Discovery
    Naguib, Mohamed
    Shabara, Yahia
    Koksal, Can Emre
    IEEE WIRELESS COMMUNICATIONS LETTERS, 2024, 13 (12) : 3350 - 3354
  • [10] HIGH-RESOLUTION BEAM PROPORTIONAL CHAMBERS
    ATAC, M
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (02): : 241 - &