Generalized reliability estimation using repeated measurements

被引:17
|
作者
Laenen, A
Vangeneugden, T
Geys, H
Molenberghs, G
机构
[1] Hasselt Univ, Ctr Stat, B-3590 Diepenbeek, Belgium
[2] Tibotec, Mechelen, Belgium
关键词
D O I
10.1348/000711005X66068
中图分类号
O1 [数学];
学科分类号
0701 ; 070101 ;
摘要
Reliability can be studied in a generalized way using repeated measurements. Linear mixed models are used to derive generalized test-retest reliability measures. The method allows for repeated measures with a different mean structure due to correction for covariate effects. Furthermore, different variance-covariance structures between measurements can be implemented. When the variance structure reduces to a random intercept (compound symmetry), classical methods are recovered. With more complex variance structures (e.g. including random slopes of time and/or serial correlation), time-dependent reliability functions are obtained. The effect of time lag between measurements on reliability estimates can be evaluated. The methodology is applied to a psychiatric scale for schizophrenia.
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页码:113 / 131
页数:19
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